A fast and reliable readout method for quantitative analysis of surface-enhanced Raman scattering nanoprobes on chip surface

Hyejin Chang, Homan Kang, Sinyoung Jeong, Eunbyeol Ko, Yoon Sik Lee, Ho Young Lee, Dae Hong Jeong

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Surface-enhanced Raman scattering techniques have been widely used for bioanalysis due to its high sensitivity and multiplex capacity. However, the point-scanning method using a micro-Raman system, which is the most common method in the literature, has a disadvantage of extremely long measurement time for on-chip immunoassay adopting a large chip area of approximately 1-mm scale and confocal beam point of ca. 1-μm size. Alternative methods such as sampled spot scan with high confocality and large-area scan method with enlarged field of view and low confocality have been utilized in order to minimize the measurement time practically. In this study, we analyzed the two methods in respect of signal-to-noise ratio and sampling-led signal fluctuations to obtain insights into a fast and reliable readout strategy. On this basis, we proposed a methodology for fast and reliable quantitative measurement of the whole chip area. The proposed method adopted a raster scan covering a full area of 100 μm × 100 μm region as a proof-of-concept experiment while accumulating signals in the CCD detector for single spectrum per frame. One single scan with 10 s over 100 μm × 100 μm area yielded much higher sensitivity compared to sampled spot scanning measurements and no signal fluctuations attributed to sampled spot scan. This readout method is able to serve as one of key technologies that will bring quantitative multiplexed detection and analysis into practice.

Original languageEnglish
Article number055004
JournalReview of Scientific Instruments
Volume86
Issue number5
DOIs
StatePublished - 1 May 2015

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Nanoprobes
Time measurement
quantitative analysis
readout
Raman scattering
chips
Raman spectra
Scanning
Chemical analysis
Charge coupled devices
Signal to noise ratio
Lead
Sampling
Detectors
time measurement
immunoassay
scanning
sensitivity
Experiments
field of view

Cite this

Chang, Hyejin ; Kang, Homan ; Jeong, Sinyoung ; Ko, Eunbyeol ; Lee, Yoon Sik ; Lee, Ho Young ; Jeong, Dae Hong. / A fast and reliable readout method for quantitative analysis of surface-enhanced Raman scattering nanoprobes on chip surface. In: Review of Scientific Instruments. 2015 ; Vol. 86, No. 5.
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A fast and reliable readout method for quantitative analysis of surface-enhanced Raman scattering nanoprobes on chip surface. / Chang, Hyejin; Kang, Homan; Jeong, Sinyoung; Ko, Eunbyeol; Lee, Yoon Sik; Lee, Ho Young; Jeong, Dae Hong.

In: Review of Scientific Instruments, Vol. 86, No. 5, 055004, 01.05.2015.

Research output: Contribution to journalArticle

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